Here is the response from the Agilent Engineer. Posted here with permission.
Please also note that I have edited my previous post to remove the word "specification" as this phenomenon is not an Agilent warranted or typical specified parameter.
Ed
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Hello Ed,
Please allow me to introduce myself. I’m an applications engineer with Agilent Technologies. I support oscilloscopes and other digital solutions. I received your email.
First of all, thanks for contacting us directly.
In fact, this is normal. This is called “interleave spur.” In general, “fast” ADCs are built up of slower ADCs by interleaving them together. The benefit is faster ADCs, of course. The down side is that you end up with these spurs. Other technologies do exist, but the max sampling rate is currently lower, and the cost is higher.
I think you have seen that the peak level on the spurs (and FFT noise floor) change with the vertical setting on the channels. This is also normal. For each setting, however, what you will find is that there is about 50 dB of Spurious Free Dynamic Range (SFDR). To be clear, if you put in a signal that takes up most of the screen for a given vertical setting, the tallest spur will be about 50 dB down. The rest for the FFT noise floor will be even lower (~10 dB). Here are two screenshots that illustrate this:
Both screenshot same FFT settings and time scale; the markers are tracking the 1 MHz input and the first spur at 125 MHz. we want to look at the delta-Y results.
Input signal: 30 mV p-p sine wave at 1 MHz; vertical scale set to 5 mV/div (image002)
Input signal: 10V p-p sine wave at 1 MHz; vertical scale set to 2 V/div (image003)
To get more SFDR, a fundamentally different instrument is needed, such as a swept tuned spectrum analyzer. A oscilloscope, On the other hand, is a general purpose instrument… a jack of all (many) trades, master of some (timing measurements).
Hope that helps! Please let me know if you have further questions.
Regards,
Kevin Smith
Applications Engineer - Ask me about USB 3.0 compliance!
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