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Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Agilent solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

應用手冊 2014-06-24

PDF PDF 746 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

分析工具 2014-05-19

Characterizing CAN Bus Arbitration - Application note
This app note will explain the CAN non-destructive bit-wise arbitration process. The InfiniiVision 4000 and 6000 X-Series oscilloscopes show examples of triggering and decoding those messages.

應用手冊 2014-04-28

PDF PDF 1.23 MB
Evaluating Oscilloscope Bandwidths for Your Application - Application Note
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

應用手冊 2014-04-23

Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Agilent E5071C ENA Option TDR

應用手冊 2014-04-21

PDF PDF 1.71 MB
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Agilent E5071C ENA Option TDR

應用手冊 2014-04-21

PDF PDF 1.03 MB
ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

應用手冊 2014-04-21

PDF PDF 2.40 MB
FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Agilent provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

應用手冊 2014-04-16

Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

應用手冊 2014-04-14

MIL-STD 1553 Eye-diagram Mask Testing - Application Note
Learn about how eye-diagram testing can be performed on differential MIL-STD 1553 signals using an oscilloscope.

應用手冊 2014-04-14

PDF PDF 1.86 MB
Switch Mode Power Supply Measurements - Application Note
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

應用手冊 2014-04-14

Evaluating Oscilloscopes to Debug Mixed-Signal Designs - Application Note
Discusses the number of channels, bandwidth, sample rates and triggering required to effectively monitor various analog and digital I/O signals in typical MCU/DSP-based embedded designs.

應用手冊 2014-04-11

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

應用手冊 2014-04-11

PDF PDF 1.90 MB
Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

應用手冊 2014-04-09

PDF PDF 3.03 MB
Oscilloscope Mask Testing for Six Sigma Quality Standards - Application Note
Learn about the QA process and Six Sigma efficiency, and explore the benefits mask testing brings to the QA process for electronic signals and achieving Six Sigma quality in as little as 1.1 seconds.

應用手冊 2014-04-03

Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

應用手冊 2014-03-25

PDF PDF 3.68 MB
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests
Agilent Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

應用手冊 2014-03-20

PDF PDF 978 KB
Automotive Serial Bus Testing - Application Note
This application note will show examples of characterizing the performance of various automotive serial buses using Agilent oscilloscopes and provide a summary of recommended probing solutions.

應用手冊 2014-03-17

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

應用手冊 2014-03-17

PDF PDF 5.41 MB
Jitter Analysis Using Agilent's InfiniiVision 6000 X-Series and Infiniium Series - Application Note
A discussion of various display formats used to view jitter including horizontal waveform histograms, TIE histograms, TIE trend waveforms, and jitter spectrum waveforms.

應用手冊 2014-03-12

Envelope Tracking and Digital Pre-Distortion PA Testing for LTE User Terminal Components - App Note
This application note discusses measurement solutions for power amplifier testing using Envelope Tracking (ET) and lookup table (LUT)-based DPD.

應用手冊 2014-03-07

Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
Learn about probing the hi-speed USB 2.0 serial bus and see some unique debugging tools and capabilities that can help you get your embedded designs to market faster.

應用手冊 2014-03-03

CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

應用手冊 2014-03-03

PDF PDF 2.63 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

應用手冊 2014-02-26

PDF PDF 1.48 MB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

應用手冊 2014-02-25

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