聯絡安捷倫專家

原子力顯微鏡、FE-SEM、頻譜放射遮罩、UTM

  • Nanoindenters Nanoindenters 

    Nanoindenters

    Nanoindenter technology provides the most advanced and dependable nano- and microscale material analysis available today.

  • 原子力顯微鏡 原子力顯微鏡 

    原子力顯微鏡

  • Scanning Electron Microscopes Scanning Electron Microscopes 

    Scanning Electron Microscopes

    The new Agilent 8500 FE-SEM is an innovative, research-grade system for imaging & characterizing materials at the nanoscale. Its compact size installs easily & delivers high resolution images and repeatable performance.

  • Universal Testing Machine (UTM) Universal Testing Machine (UTM) 

    Universal Testing Machine (UTM)

    The Agilent universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization.