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White paper: Implementing parallel voltage measurement in functional Test of Automotive ECUs

   This white paper compares throughput performance using conventional functional test methods versus parallel testing with Agilent’s new TS8900 Functional Test System and its M9216A multi-channel high voltage digital acquisition module. It also suggests concepts on how the TS8900 and M9216A can be implemented to improve fault coverage, including testing for ‘mavericks’. 

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