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Download Your Free Copies of the Latest Power of Wireless Application Notes

Welcome to the Power of Wireless. You face increasing technical and operational complexity. Agilent’s wireless design and test solutions help you anticipate these growing complexities so you can accelerate your ability to achieve both engineering and business goals faster. The Power to Accelerate Wireless Design and Test.

NEW Solutions Application Notes
 

  • New! Solutions for WLAN 802.11ac Manufacturing Test - Testing 802.11ac Client and Infrastructure Devices Using a Fast, Flexible and Cost-Effective Calibration and Non-Signaling Verification Solution
  • New! Solutions for Millimeter Wave Wireless Backhaul – Designing and Testing E-Band Backhaul Using Effective Network Analysis, and Signal Generation and Analysis Solutions
  • New! Solutions for LTE-Advanced Manufacturing Test - Understanding the Requirements for LTE-Advanced Carrier Aggregation Manufacturing Test
  • New! Solutions for Emerging 4G and WLAN Communication Systems - Making Digital Pre-Distortion with Memory Effects Fast and Practical for all Engineers
  • New! Solutions for LTE Conformance Testing - Using a Flexible Test System Based on a Single Hardware Platform to Overcome the Challenges of Testing LTE UE Conformance to the 3GPP Specifications Solution

 

Additional available Power of Wireless application note categories include:
 

Solutions for Cellular (LTE, LTE-A, MIPI-DigRF, HSPA, W-CDMA, etc.)
Including the app note
Solutions for Evaluating Beamforming Performance in LTE Base Stations - Using Signal Analysis and Generation to Accurately Visualize and Verify TD-LTE Beamforming Signals
17 App Notes to date
 
Solutions for MIMO, Wireless Connectivity (WLAN, WiMAX, Bluetooth, etc.) and General Wireless
Including the app note
Solutions for Design and Test of 802.11ac MIMO - Combining Simulation with Test Solutions to Realize High-Performance 802.11ac MIMO Designs
13 App Notes to date
 
Solutions for Component Test with New X-Parameters
Including the app note
Solutions for Memory Effects in Microwave Components - X-Parameters to Characterize and Model Long-Term Memory Effects of Wideband Modulated Signals
7 App Notes to date
 

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